A Parallel Built-In Self-Diagnostic Method For Embedded Memory Buffers
نویسندگان
چکیده
Ab8t~ac t In this paper, we propose a new built-in selfdiagnosis (BISD) method to simultoneoualy diagnose and repair spatially distributed memory modules with different sizes. Based on the serial interfacing technique, the serial fault masking effect is observed and a bi-directional serial interfacing technique is proposed to deal with such an issue. B y tolerating redundant read/write operations, we develop a new march algorithm called DiagRSMarch to achieve the goals of low hardware overhead, tolemble diagnostic time, and high diagnostic coverage.
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تاریخ انتشار 2001